Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. / Shen, Quan; Hlawacek, Gregor; Kratzer, Markus et al.
2010. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
2010. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Shen, Q, Hlawacek, G, Kratzer, M, Flesch, H-G, Potocar, T, Resel, R, Winkler, A & Teichert, C 2010, 'Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy', International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich, 30/05/10 - 3/06/10.
APA
Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A., & Teichert, C. (2010). Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
Vancouver
Shen Q, Hlawacek G, Kratzer M, Flesch HG, Potocar T, Resel R et al.. Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. 2010. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
Author
Bibtex - Download
@conference{f0440aa017df4616862a019cbd6a5be6,
title = "Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy",
author = "Quan Shen and Gregor Hlawacek and Markus Kratzer and Heinz-Georg Flesch and Thomas Potocar and Roland Resel and Adolf Winkler and Christian Teichert",
year = "2010",
language = "English",
note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
AU - Shen, Quan
AU - Hlawacek, Gregor
AU - Kratzer, Markus
AU - Flesch, Heinz-Georg
AU - Potocar, Thomas
AU - Resel, Roland
AU - Winkler, Adolf
AU - Teichert, Christian
PY - 2010
Y1 - 2010
M3 - Poster
T2 - International Workshop on In situ characterization of near-surface processes
Y2 - 30 May 2010 through 3 June 2010
ER -
