Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

Research output: Contribution to conferencePosterResearchpeer-review

Standard

Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. / Shen, Quan; Hlawacek, Gregor; Kratzer, Markus et al.
2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Shen, Q, Hlawacek, G, Kratzer, M, Flesch, H-G, Potocar, T, Resel, R, Winkler, A & Teichert, C 2010, 'Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy', International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria, 30/05/10 - 3/06/10.

APA

Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A., & Teichert, C. (2010). Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.

Vancouver

Shen Q, Hlawacek G, Kratzer M, Flesch HG, Potocar T, Resel R et al.. Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. 2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.

Author

Shen, Quan ; Hlawacek, Gregor ; Kratzer, Markus et al. / Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.

Bibtex - Download

@conference{f0440aa017df4616862a019cbd6a5be6,
title = "Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy",
author = "Quan Shen and Gregor Hlawacek and Markus Kratzer and Heinz-Georg Flesch and Thomas Potocar and Roland Resel and Adolf Winkler and Christian Teichert",
year = "2010",
language = "English",
note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

AU - Shen, Quan

AU - Hlawacek, Gregor

AU - Kratzer, Markus

AU - Flesch, Heinz-Georg

AU - Potocar, Thomas

AU - Resel, Roland

AU - Winkler, Adolf

AU - Teichert, Christian

PY - 2010

Y1 - 2010

M3 - Poster

T2 - International Workshop on In situ characterization of near-surface processes

Y2 - 30 May 2010 through 3 June 2010

ER -