Dislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction

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Dislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction. / Kirchlechner, Christoph; Kiener, Daniel; Motz, Christian et al.
in: Philosophical magazine, Jahrgang 91, 2011, S. 1256-1264.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{a400cb3f6dfe40399e6505ccd4dc155c,
title = "Dislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction",
author = "Christoph Kirchlechner and Daniel Kiener and Christian Motz and S. Labat and N. Vaxelaire and O. Perroud and J.-S. Micha and O. Ulrich and O. Thomas and Gerhard Dehm and Jozef Keckes",
year = "2011",
doi = "10.1080/14786431003785639",
language = "English",
volume = "91",
pages = "1256--1264",
journal = "Philosophical magazine",
issn = "0031-8086",

}

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TY - JOUR

T1 - Dislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction

AU - Kirchlechner, Christoph

AU - Kiener, Daniel

AU - Motz, Christian

AU - Labat, S.

AU - Vaxelaire, N.

AU - Perroud, O.

AU - Micha, J.-S.

AU - Ulrich, O.

AU - Thomas, O.

AU - Dehm, Gerhard

AU - Keckes, Jozef

PY - 2011

Y1 - 2011

U2 - 10.1080/14786431003785639

DO - 10.1080/14786431003785639

M3 - Article

VL - 91

SP - 1256

EP - 1264

JO - Philosophical magazine

JF - Philosophical magazine

SN - 0031-8086

ER -