Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

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Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. / Eiper, Ernst; Martinschitz, Klaus-Jürgen; Keckes, Jozef.
in: Powder diffraction, Jahrgang 20, 2005, S. 1-5.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{e73ca8d3265345489f0d403fd0bcf69e,
title = "Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films",
author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Jozef Keckes",
year = "2005",
language = "English",
volume = "20",
pages = "1--5",
journal = "Powder diffraction",
issn = "0885-7156",
publisher = "Cambridge University Press",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

AU - Eiper, Ernst

AU - Martinschitz, Klaus-Jürgen

AU - Keckes, Jozef

PY - 2005

Y1 - 2005

M3 - Article

VL - 20

SP - 1

EP - 5

JO - Powder diffraction

JF - Powder diffraction

SN - 0885-7156

ER -