Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. / Eiper, Ernst; Martinschitz, Klaus-Jürgen; Keckes, Jozef.
in: Powder diffraction, Jahrgang 20, 2005, S. 1-5.
in: Powder diffraction, Jahrgang 20, 2005, S. 1-5.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Eiper, E, Martinschitz, K-J & Keckes, J 2005, 'Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films', Powder diffraction, Jg. 20, S. 1-5.
APA
Eiper, E., Martinschitz, K.-J., & Keckes, J. (2005). Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. Powder diffraction, 20, 1-5.
Vancouver
Eiper E, Martinschitz KJ, Keckes J. Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films. Powder diffraction. 2005;20:1-5.
Author
Bibtex - Download
@article{e73ca8d3265345489f0d403fd0bcf69e,
title = "Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films",
author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Jozef Keckes",
year = "2005",
language = "English",
volume = "20",
pages = "1--5",
journal = "Powder diffraction",
issn = "0885-7156",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
AU - Eiper, Ernst
AU - Martinschitz, Klaus-Jürgen
AU - Keckes, Jozef
PY - 2005
Y1 - 2005
M3 - Article
VL - 20
SP - 1
EP - 5
JO - Powder diffraction
JF - Powder diffraction
SN - 0885-7156
ER -
