Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

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Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. / Riedl, Angelika; Todt, J.; Daniel, Rostislav et al.
2013. Postersitzung präsentiert bei 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Österreich.

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Harvard

Riedl, A, Todt, J, Daniel, R, Steffenelli, M, Holec, D, Krywka, C, Mitterer, C & Keckes, J 2013, 'Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction', 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Österreich, 10/03/13 - 16/03/13.

APA

Riedl, A., Todt, J., Daniel, R., Steffenelli, M., Holec, D., Krywka, C., Mitterer, C., & Keckes, J. (2013). Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. Postersitzung präsentiert bei 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Österreich.

Vancouver

Riedl A, Todt J, Daniel R, Steffenelli M, Holec D, Krywka C et al.. Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. 2013. Postersitzung präsentiert bei 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Österreich.

Author

Riedl, Angelika ; Todt, J. ; Daniel, Rostislav et al. / Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. Postersitzung präsentiert bei 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Österreich.

Bibtex - Download

@conference{d2cbf17227214e3eb3c587df62dbaea5,
title = "Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction",
author = "Angelika Riedl and J. Todt and Rostislav Daniel and M. Steffenelli and David Holec and C. Krywka and Christian Mitterer and Jozef Keckes",
year = "2013",
language = "English",
note = "8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation ; Conference date: 10-03-2013 Through 16-03-2013",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction

AU - Riedl, Angelika

AU - Todt, J.

AU - Daniel, Rostislav

AU - Steffenelli, M.

AU - Holec, David

AU - Krywka, C.

AU - Mitterer, Christian

AU - Keckes, Jozef

PY - 2013

Y1 - 2013

M3 - Poster

T2 - 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation

Y2 - 10 March 2013 through 16 March 2013

ER -