Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. / Riedl, Angelika; Todt, J.; Daniel, Rostislav et al.
2013. Poster session presented at 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Austria.
2013. Poster session presented at 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Austria.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Riedl, A, Todt, J, Daniel, R, Steffenelli, M, Holec, D, Krywka, C, Mitterer, C & Keckes, J 2013, 'Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction', 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Austria, 10/03/13 - 16/03/13.
APA
Riedl, A., Todt, J., Daniel, R., Steffenelli, M., Holec, D., Krywka, C., Mitterer, C., & Keckes, J. (2013). Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. Poster session presented at 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Austria.
Vancouver
Riedl A, Todt J, Daniel R, Steffenelli M, Holec D, Krywka C et al.. Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction. 2013. Poster session presented at 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation, Irdning, Austria.
Author
Bibtex - Download
@conference{d2cbf17227214e3eb3c587df62dbaea5,
title = "Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction",
author = "Angelika Riedl and J. Todt and Rostislav Daniel and M. Steffenelli and David Holec and C. Krywka and Christian Mitterer and Jozef Keckes",
year = "2013",
language = "English",
note = "8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation ; Conference date: 10-03-2013 Through 16-03-2013",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction
AU - Riedl, Angelika
AU - Todt, J.
AU - Daniel, Rostislav
AU - Steffenelli, M.
AU - Holec, David
AU - Krywka, C.
AU - Mitterer, Christian
AU - Keckes, Jozef
PY - 2013
Y1 - 2013
M3 - Poster
T2 - 8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation
Y2 - 10 March 2013 through 16 March 2013
ER -
