A cantilever method to determine depth profiles of residual stresses on the nanoscale
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
A cantilever method to determine depth profiles of residual stresses on the nanoscale. / Massl, Stefan; Keckes, Jozef; Pippan, Reinhard.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Massl, S, Keckes, J & Pippan, R 2006, 'A cantilever method to determine depth profiles of residual stresses on the nanoscale', Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, USA / Vereinigte Staaten, 30/07/06 - 4/08/06.
APA
Massl, S., Keckes, J., & Pippan, R. (2006). A cantilever method to determine depth profiles of residual stresses on the nanoscale. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
Vancouver
Massl S, Keckes J, Pippan R. A cantilever method to determine depth profiles of residual stresses on the nanoscale. 2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
Author
Bibtex - Download
@conference{da55beb9e55f49c086a745442349d4ff,
title = "A cantilever method to determine depth profiles of residual stresses on the nanoscale",
author = "Stefan Massl and Jozef Keckes and Reinhard Pippan",
year = "2006",
language = "English",
note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - A cantilever method to determine depth profiles of residual stresses on the nanoscale
AU - Massl, Stefan
AU - Keckes, Jozef
AU - Pippan, Reinhard
PY - 2006
Y1 - 2006
M3 - Poster
T2 - Gordon Research Conference on thin film & small scale mechanical behavior
Y2 - 30 July 2006 through 4 August 2006
ER -
