A cantilever method to determine depth profiles of residual stresses on the nanoscale

Research output: Contribution to conference › Poster › Research › peer-review

A cantilever method to determine depth profiles of residual stresses on the nanoscale. / Massl, Stefan; Keckes, Jozef; Pippan, Reinhard.
2006. Poster session presented at Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, Maine, United States.

Research output: Contribution to conference › Poster › Research › peer-review

Massl, S, Keckes, J & Pippan, R 2006, 'A cantilever method to determine depth profiles of residual stresses on the nanoscale', Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, United States, 30/07/06 - 4/08/06.

Massl, S., Keckes, J., & Pippan, R. (2006). A cantilever method to determine depth profiles of residual stresses on the nanoscale. Poster session presented at Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, Maine, United States.

Massl S, Keckes J, Pippan R. A cantilever method to determine depth profiles of residual stresses on the nanoscale. 2006. Poster session presented at Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, Maine, United States.

Massl, Stefan ; Keckes, Jozef ; Pippan, Reinhard. / A cantilever method to determine depth profiles of residual stresses on the nanoscale. Poster session presented at Gordon Research Conference on thin film & small scale mechanical behavior, Waterville, Maine, United States.

@conference{da55beb9e55f49c086a745442349d4ff,

title = "A cantilever method to determine depth profiles of residual stresses on the nanoscale",

author = "Stefan Massl and Jozef Keckes and Reinhard Pippan",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

}

TY - CONF

T1 - A cantilever method to determine depth profiles of residual stresses on the nanoscale

AU - Massl, Stefan

AU - Keckes, Jozef

AU - Pippan, Reinhard

PY - 2006

Y1 - 2006

M3 - Poster

T2 - Gordon Research Conference on thin film & small scale mechanical behavior

Y2 - 30 July 2006 through 4 August 2006

ER -

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