Transport, optical and electronic properties of the half metal CrO2

Mazin, I. I., Singh, D. J. & Draxl, C., 1999, in: Journal of applied physics. 85, S. 6220-6220

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Wide band gaps and low-loss wave guiding in ceramic high-dielectric-contrast photonic crystals

Meisels, R., Oberhumer, P., Kuchar, F., Aldrian, F. & Gajic, R., 2007, in: Journal of applied physics. 102, S. 094106-1-094106-4

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Structural properties of wurtzitelike ScGaN films grown by NH3-molecular beam epitaxy

Moram, M. A., Zhang, Y., Joyce, T. B., Holec, D., Chalker, P. R., Mayrhofer, P. H., Kappers, M. J. & Humphreys, C. J., 2009, in: Journal of applied physics. 106, S. 1135331-1135336

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Microstructure and mechancial properties of sputtered intermetallic Al-Au coatings

Moser, M., Mayrhofer, P. H., Ross, I. M. & Rainforth, W. M., 2007, in: Journal of applied physics. 102, S. 023523-1-023523-6

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Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations

Mühlbacher, M., Bochkarev, A. S., Mendez Martin, F., Sartory, B., Chitu, L., Popov, M., Puschnig, P., Spitaler, J., Ding, H., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 26 Aug. 2015, (Elektronische Veröffentlichung vor Drucklegung.) in: Journal of applied physics. 118.2015, 8, 085307.

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Reentrant spin-glass behavior and bipolar exchange-bias effect in Sn substituted cobalt-orthotitanate

Nayak, S., Joshi, D. C., Krautz, M., Waske, A., Eckert, J. & Thota, S., 28 Jan. 2016, in: Journal of applied physics. 119, 4, 043901.

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Experiment and simulation of the compositional evolution of Ti-B thin films by sputtering of a compound target

Neidhardt, J., Mraz, S., Schneider, J. M., Strub, E., Bohne, W., Liedke, B., Möller, W. & Mitterer, C., 2008, in: Journal of applied physics. 104, S. 063304-1-063304-10

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Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films

Neidhardt, J., Walter, C., Molina-Aldareguia, J. M., Herrmann, M., Clegg, W. J. & Hultman, L., 2008, in: Journal of applied physics. 103, S. 123515-1-123515-8

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Broadband optoacoustic measurements of ultrasound attenuation in severely plastically deformed nickel

Pippan, R., Kazhushko, V. V., Paltauf, G., Krenn, H. & Scheriau, S., 2010, in: Journal of applied physics. S. 094905-094905

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A structural and topographical study of low-pressure chemical-vapor-deposited polysilicon by scanning probe microscopy

Pleschinger, A., Lutz, J. & Kuchar, F., 1997, in: Journal of applied physics. 81, S. 6749-6754

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