Towards electro-thermo-mechanical lifetime assessment for arbitrary power electronics
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In: Microelectronics Reliability, Vol. 133.2022, No. June, 114537, 04.05.2022.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Towards electro-thermo-mechanical lifetime assessment for arbitrary power electronics
AU - Gschwandl, Mario
AU - Friedrich, Birgit Ella
AU - Pfost, Martin
AU - Antretter, Thomas
AU - Fuchs, Peter Filipp
AU - Mitev, Ivaylo
AU - Tao, Qi
AU - Schingale, Angelika
N1 - Publisher Copyright: © 2022
PY - 2022/5/4
Y1 - 2022/5/4
KW - Finite element analysis
KW - Power electronics
KW - Printed circuit boards
KW - Reliability
UR - http://www.scopus.com/inward/record.url?scp=85129248926&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2022.114537
DO - 10.1016/j.microrel.2022.114537
M3 - Article
AN - SCOPUS:85129248926
VL - 133.2022
JO - Microelectronics Reliability
JF - Microelectronics Reliability
SN - 0026-2714
IS - June
M1 - 114537
ER -