TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

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Authors

Translated title of the contribution	TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings
Original language	English
Pages (from-to)	1857-1861
Journal	Analytical and bioanalytical chemistry
DOIs	https://doi.org/10.1007/sO0216-008-2525-7
Publication status	Published - 2009