TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

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TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings. / Schnöller, J.; Franz, Robert; Mitterer, Christian et al.
In: Analytical and bioanalytical chemistry, 2009, p. 1857-1861.

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@article{9c13e57682f44318b4dce3386c8a356b,
title = "TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings",
author = "J. Schn{\"o}ller and Robert Franz and Christian Mitterer and H. Hutter",
year = "2009",
doi = "10.1007/sO0216-008-2525-7",
language = "English",
pages = "1857--1861",
journal = "Analytical and bioanalytical chemistry",
issn = "1618-2642",
publisher = "Springer Berlin",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

AU - Schnöller, J.

AU - Franz, Robert

AU - Mitterer, Christian

AU - Hutter, H.

PY - 2009

Y1 - 2009

U2 - 10.1007/sO0216-008-2525-7

DO - 10.1007/sO0216-008-2525-7

M3 - Article

SP - 1857

EP - 1861

JO - Analytical and bioanalytical chemistry

JF - Analytical and bioanalytical chemistry

SN - 1618-2642

ER -