Thin Film Adhesion of Flexible Electronics Influenced by Interlayers
Research output: Contribution to journal › Article › Research › peer-review
Standard
Thin Film Adhesion of Flexible Electronics Influenced by Interlayers. / Kleinbichler, Andreas; Bartosik, Mattias; Völker, Bernhard et al.
In: Advanced engineering materials, Vol. 19.2017, No. 4, 1600665, 2017.
In: Advanced engineering materials, Vol. 19.2017, No. 4, 1600665, 2017.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Kleinbichler, A, Bartosik, M, Völker, B & Cordill, M 2017, 'Thin Film Adhesion of Flexible Electronics Influenced by Interlayers', Advanced engineering materials, vol. 19.2017, no. 4, 1600665. https://doi.org/10.1002/adem.201600665
APA
Kleinbichler, A., Bartosik, M., Völker, B., & Cordill, M. (2017). Thin Film Adhesion of Flexible Electronics Influenced by Interlayers. Advanced engineering materials, 19.2017(4), Article 1600665. https://doi.org/10.1002/adem.201600665
Vancouver
Kleinbichler A, Bartosik M, Völker B, Cordill M. Thin Film Adhesion of Flexible Electronics Influenced by Interlayers. Advanced engineering materials. 2017;19.2017(4):1600665. doi: 10.1002/adem.201600665
Author
Bibtex - Download
@article{d6986d8799cb4bb694f477268f5f58c3,
title = "Thin Film Adhesion of Flexible Electronics Influenced by Interlayers",
author = "Andreas Kleinbichler and Mattias Bartosik and Bernhard V{\"o}lker and Megan Cordill",
year = "2017",
doi = "10.1002/adem.201600665",
language = "English",
volume = "19.2017",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",
number = "4",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Thin Film Adhesion of Flexible Electronics Influenced by Interlayers
AU - Kleinbichler, Andreas
AU - Bartosik, Mattias
AU - Völker, Bernhard
AU - Cordill, Megan
PY - 2017
Y1 - 2017
UR - http://www.scopus.com/inward/record.url?scp=85006699583&partnerID=8YFLogxK
U2 - 10.1002/adem.201600665
DO - 10.1002/adem.201600665
M3 - Article
AN - SCOPUS:85006699583
VL - 19.2017
JO - Advanced engineering materials
JF - Advanced engineering materials
SN - 1438-1656
IS - 4
M1 - 1600665
ER -
