The contact charging of insulators by atomic force microscopy
Research output: Contribution to conference › Poster › Research › peer-review
Standard
The contact charging of insulators by atomic force microscopy. / Mirkowska, Monika; Kratzer, Markus; Teichert, Christian et al.
2012. Poster session presented at ÖPG 2012, Graz, Austria.
2012. Poster session presented at ÖPG 2012, Graz, Austria.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Mirkowska, M, Kratzer, M, Teichert, C & Flachberger, H 2012, 'The contact charging of insulators by atomic force microscopy', ÖPG 2012, Graz, Austria, 18/10/12 - 21/10/12.
APA
Mirkowska, M., Kratzer, M., Teichert, C., & Flachberger, H. (2012). The contact charging of insulators by atomic force microscopy. Poster session presented at ÖPG 2012, Graz, Austria.
Vancouver
Mirkowska M, Kratzer M, Teichert C, Flachberger H. The contact charging of insulators by atomic force microscopy. 2012. Poster session presented at ÖPG 2012, Graz, Austria.
Author
Bibtex - Download
@conference{e866fe6066e34423bb5f3f34799896c5,
title = "The contact charging of insulators by atomic force microscopy",
author = "Monika Mirkowska and Markus Kratzer and Christian Teichert and Helmut Flachberger",
year = "2012",
language = "English",
note = "{\"O}PG 2012 ; Conference date: 18-10-2012 Through 21-10-2012",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - The contact charging of insulators by atomic force microscopy
AU - Mirkowska, Monika
AU - Kratzer, Markus
AU - Teichert, Christian
AU - Flachberger, Helmut
PY - 2012
Y1 - 2012
M3 - Poster
T2 - ÖPG 2012
Y2 - 18 October 2012 through 21 October 2012
ER -
