Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
Research output: Contribution to journal › Article › Research › peer-review
Standard
Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction. / Sonnweber-Ribic, Petra; Gruber, P.; Dehm, Gerhard et al.
In: Acta materialia, Vol. 55, 2007, p. 765-766.
In: Acta materialia, Vol. 55, 2007, p. 765-766.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Sonnweber-Ribic, P, Gruber, P, Dehm, G & Arzt, E 2007, 'Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction', Acta materialia, vol. 55, pp. 765-766.
APA
Sonnweber-Ribic, P., Gruber, P., Dehm, G., & Arzt, E. (2007). Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction. Acta materialia, 55, 765-766.
Vancouver
Sonnweber-Ribic P, Gruber P, Dehm G, Arzt E. Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction. Acta materialia. 2007;55:765-766.
Author
Bibtex - Download
@article{b99dd66e58d646b698df57b5bc1a1dec,
title = "Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction",
author = "Petra Sonnweber-Ribic and P. Gruber and Gerhard Dehm and Eduard Arzt",
year = "2007",
language = "English",
volume = "55",
pages = "765--766",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
AU - Sonnweber-Ribic, Petra
AU - Gruber, P.
AU - Dehm, Gerhard
AU - Arzt, Eduard
PY - 2007
Y1 - 2007
M3 - Article
VL - 55
SP - 765
EP - 766
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -
