Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction
Research output: Contribution to journal › Article › Research › peer-review
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| Translated title of the contribution | Texture transition in Cu thin films: Electron backscatter diffraction vs. X-ray diffraction |
|---|---|
| Original language | English |
| Pages (from-to) | 765-766 |
| Journal | Acta materialia |
| Volume | 55 |
| Publication status | Published - 2007 |
