Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods
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| Translated title of the contribution | Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2ψ Methods |
|---|---|
| Original language | English |
| Pages (from-to) | 711-715 |
| Journal | Materials Science Forum |
| Volume | 524-525 |
| Publication status | Published - 2006 |
