Research output

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2006
Published
Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8
Research output: Contribution to journal › Article › Research › peer-review
Published
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351
Research output: Contribution to journal › Article › Research › peer-review
Published
Characterization of cellulose fiber surfaces and cross-sections using atomic force microscopy
Hosemann, P., Schmied, F., Teichert, C. & Schuster, K. C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Characterization of piezo ceramics on the nano scale by Conducting AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Characterization of piezo ceramics on the nano scale by Conducting AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Characterization of semi-conducting nanorods by AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Characterization of semiconducting nanorods by AFM and conducting AFM
Andreev, A., Hou, Y. & Teichert, C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Coherent random lasing in the deep blue from self-assembled organic nanofibers
Andreev, A., Quochi, F., Cordella, F., Mura, A., Bongiovanni, G., Sitter, H., Hlawacek, G., Teichert, C. & Sariciftci, N. S., 2006, In: Journal of applied physics. 99, p. 034305-1-034305-6
Research output: Contribution to journal › Article › Research › peer-review
Published
Controlling molecular orientation of sexiphenyl thin films
Hlawacek, G., Andreev, A. & Teichert, C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Controlling molecular orientation of sexiphenyl thin films
Hlawacek, G., Andreev, A. & Teichert, C., 2006.
Research output: Contribution to conference › Poster › Research › peer-review

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Research Portal

Research output

Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

Characterization of cellulose fiber surfaces and cross-sections using atomic force microscopy

Characterization of piezo ceramics on the nano scale by Conducting AFM

Characterization of piezo ceramics on the nano scale by Conducting AFM

Characterization of semi-conducting nanorods by AFM

Characterization of semiconducting nanorods by AFM and conducting AFM

Coherent random lasing in the deep blue from self-assembled organic nanofibers

Controlling molecular orientation of sexiphenyl thin films

Controlling molecular orientation of sexiphenyl thin films

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