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2015
Published
Pencil-beam X-ray nanodiffraction on CVD α-Al₂O₃ hard coatings with grain sizes in the micrometer range
Tkadletz, M., Keckes, J., Schalk, N., Czettl, C. & Mitterer, C., 2015.
Research output: Contribution to conference › Presentation › Research › peer-review
Published
Recent progress in advanced characterization methods for the development of hard coatings: From improved composition/microstructure/property relations to insights in degradation behavior
Mitterer, C., Mühlbacher, M., Zeilinger, A., Stefenelli, M., Daniel, R., Tkadletz, M., Schalk, N., Sartory, B. & Keckes, J., 2015.
Research output: Contribution to conference › Presentation › Research › peer-review
Published
Residual stress gradients in alpha-Al2O3 hard coatings determined by pencil-beam X-ray nanodiffraction: The influence of blasting media
Tkadletz, M., Keckes, J., Schalk, N., Krajinovic, I., Burghammer, M., Czettl, C. & Mitterer, C., 2015, In: Surface & coatings technology. 262, p. 134-140
Research output: Contribution to journal › Article › Research › peer-review
Published
Residual stress gradients in α-Al2O3 hard coatings determined by pencil-beam X-ray nanodiffraction: The influence of blasting media
Tkadletz, M., Keckes, J., Schalk, N., Krajinovic, I., Burghammer, M., Czettl, C. & Mitterer, C., 2015, In: Surface & coatings technology. 262, p. 134 - 140 7 p.
Research output: Contribution to journal › Article › Research › peer-review
Published
Resolving depth evolution of microstructure and hardness in sputtered CrN film
Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79
Research output: Contribution to journal › Article › Research › peer-review
Published
Restrictions of wafer curvature stress measurements by thermally induced plastic substrate deformation
Saringer, C., Tkadletz, M. & Mitterer, C., 2015.
Research output: Contribution to conference › Presentation › Research › peer-review
Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Stacking fault energies and the generalized stacking fault energy of γ-TiAl (ongoing Masterthesis)
Dumitraschkewitz, P., Clemens, H., Mayer, S. & Holec, D., 2015.
Research output: Contribution to conference › Presentation › Research › peer-review
Published
Structural and mechanical properties of nitrogen-deficient cubic Cr-Mo-N and Cr-W-N systems
Zhou, L., Klimashin, F., Holec, D. & Mayrhofer, P., 2015.
Research output: Contribution to conference › Presentation › Research › peer-review
Published
Structure-property relations in reactively sputtered molybdenum oxide thin films
Pachlhofer, J., Jachs, C., Franz, R., Franzke, E., Winkler, J. & Mitterer, C., 2015.
Research output: Contribution to conference › Presentation › Research › peer-review

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