Research output

  1. 2013
  2. Published

    Atomic force microscopy based manipulation of graphene using dynamic plowing lithography

    Vasić, B., Kratzer, M., Matković, A., Nevosad, A., Ralević, U., Jovanović, D., Ganser, C., Teichert, C. & Gajić, R., 2013, In: Nanotechnology. 24, p. 015303-015303

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Charge behavior on insulating monocrystallic surfaces by Kelvin probe force microscopy

    Mirkowska, M., Kratzer, M., Teichert, C. & Flachberger, H., 2013.

    Research output: Contribution to conferencePosterResearchpeer-review

  4. Published

    Charging behavior of the calcite (100) surface investigated by KPFM

    Mirkowska, M., Kratzer, M., Teichert, C. & Flachberger, H., 2013.

    Research output: Contribution to conferencePosterResearchpeer-review

  5. Published

    Elektrostatische Trennung in der Rohstoffverarbeitung - Bestandsaufnahme, Herausforderungen und Ausblick

    Flachberger, H., Mirkowska, M., Oberrauner, A., Geißler, T., Kratzer, M. & Teichert, C., 2013, Rohstoffe sind Zukunft. p. 349-369

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  6. Published
  7. Published

    Photoresponse from single upright standing ZnO nanorods explored by photoconductive atomic force microscopy

    Beinik, I., Kratzer, M., Teichert, C., Wachauer, A., Wang, L., Pyriatinsky, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurisic, A., 2013, In: Beilstein journal of nanotechnology . 4, p. 208-217

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    Temperature dependent growth morphologies of parahexaphenyl on SiO2 supported exfoliated graphene

    Kratzer, M., Klima, S., Teichert, C., Gajić, R., Vasić, B., Matković, A. & Ralevic, U., 2013, In: Journal of vacuum science & technology / B (JVST). 31, p. 04D114-1-04D114-7

    Research output: Contribution to journalArticleResearchpeer-review

  9. 2012
  10. Published

    Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurišić, A. B., 1 Oct 2012, In: Journal of applied physics. 112.2012, 7, 1 p., 079903.

    Research output: Contribution to journalComment/debatepeer-review

  11. Published

    Dynamic plowing lithography and 6P thin film growth on graphene investigated by atomic force microscopy

    Kratzer, M., Klima, S., Vasić, B., Gajić, R., Matković, A., Ralević, U. & Teichert, C., 2012.

    Research output: Contribution to conferencePosterResearchpeer-review

  12. Published

    Electrical and photovoltaic properties of self assembled Ge nanodomes on Si(001)

    Kratzer, M., Prehal, C., Rubezhanska, M., Beinik, I., Kondratenko, S., Kozyrev, Y. & Teichert, C., 2012, In: Physical review : B, Condensed matter and materials physics. 86, p. 245320-1-245320-7

    Research output: Contribution to journalArticleResearchpeer-review