Research output

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2008
Published
Visualizing the Behavior of Dislocations - Seeing Is Believing
Robertson, I. M., Ferreira, P. J., Dehm, G., Hull, R. & Stach, E. A., 2008, In: MRS Bulletin. 33, p. 122-131
Research output: Contribution to journal › Article › Research › peer-review
2007
Published
A Comparison of the Electronic Structure of N-K in TiN and VN using EELS and ab-initio Calculations
Rashkova, B., Kothleitner, G., Sturm, S., Scheu, C., Kutschej, K., Mitterer, C., Lazar, P., Redinger, J., Podloucky, R. & Dehm, G., 2007, Microscopy and Microanalysis. p. 414-415
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Published
Characterization of mechanical properties on the micron size. Bericht 1
Kiener, D. & Dehm, G., 2007
Research output: Book/Report › Commissioned report › Transfer › peer-review
Published
Characterization of mechanical properties on the micron size. Bericht 2
Kiener, D. & Dehm, G., 2007
Research output: Book/Report › Commissioned report › Transfer › peer-review
Published
Combination of ab-initio and N-K, Ti-L2,3, V-L2,3 electron energy-loss near edge structure studies for TiN and VN films
Rashkova, B., Lazar, P., Redinger, J., Podloucky, R., Kothleitner, G., Sturm, S., Kutschej, K., Mitterer, C., Scheu, C. & Dehm, G., 2007, In: International journal of materials research : IJMR ; Zeitschrift für Metallkunde. 98, p. 1060-1065
Research output: Contribution to journal › Article › Research › peer-review
Published
Conventional TEM Investigation of the FIB Damage in Copper
Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, Microscopy Conference, International Forum for Advanced Microscopy. p. 100-101
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Published
Conventional TEM investigation of the FIB damage in copper
Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101
Research output: Contribution to journal › Article › Research › peer-review
Published
Damage development during cyclic loading - from micro to macro properties. Bericht 1
Yang, B. & Dehm, G., 2007
Research output: Book/Report › Commissioned report › Transfer › peer-review
Published
Damage development during cyclic loading - from micro to macro properties. Bericht 2
Yang, B. & Dehm, G., 2007
Research output: Book/Report › Commissioned report › Transfer › peer-review
Published
Dynamical growth of Cu–Pt nanowires with a nanonecklace morphology
Inkson, B. J., Dehm, G. & Pen, Y., 2007, In: Nanotechnology. 18, p. 601-606
Research output: Contribution to journal › Article › Research › peer-review

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Research Portal

Research output

Visualizing the Behavior of Dislocations - Seeing Is Believing

A Comparison of the Electronic Structure of N-K in TiN and VN using EELS and ab-initio Calculations

Characterization of mechanical properties on the micron size. Bericht 1

Characterization of mechanical properties on the micron size. Bericht 2

Combination of ab-initio and N-K, Ti-L2,3, V-L2,3 electron energy-loss near edge structure studies for TiN and VN films

Conventional TEM Investigation of the FIB Damage in Copper

Conventional TEM investigation of the FIB damage in copper

Damage development during cyclic loading - from micro to macro properties. Bericht 1

Damage development during cyclic loading - from micro to macro properties. Bericht 2

Dynamical growth of Cu–Pt nanowires with a nanonecklace morphology

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