Research output

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  1. 2012
  2. Published

    Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

    Moser, G., Felber, H., Rashkova, B., Imrich, P. J., Kirchlechner, C., Grosinger, W., Motz, C., Dehm, G. & Kiener, D., 2012, In: Practical metallography = Praktische Metallographie. 49, p. 343-355

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

    Daniel, R., Keckes, J. & Mitterer, C., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    TEM characterization of CrN thin films epitaxially grown on MgO (001)

    Harzer, T. P., Kormout, K., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Thermally treated hard coatings characterized by XRD coupled with four-point bending

    Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

    Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751

    Research output: Contribution to journal › Article › Research › peer-review

  7. 2011
  8. Published

    A Mechanical Method for Preparing TEM Samples from Brittle Films on Compliant Substrates

    Taylor, A. A., Cordill, M., Moser, G. & Dehm, G., 2011, In: Practical metallography = Praktische Metallographie. 48, p. 408-413

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

    Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.

    Research output: Contribution to conference › Poster › Research › peer-review

  10. Published

    Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM

    Zhang, Z., Daniel, R. & Mitterer, C., 2011.

    Research output: Contribution to conference › Poster › Research › peer-review

  11. Published

    Atomic and electronic structures of a transition layer at the CrN/Cr interface

    Zhang, Z., Daniel, R. & Mitterer, C., 2011, In: Journal of applied physics. 110, p. 043524-1-043524-4

    Research output: Contribution to journal › Article › Research › peer-review

  12. Published

    Comparative studies of the CrN-Cr-Si an d CrN-Si interfaces by Cs-corrected HRTEM and STEM-EELS

    Zhang, Z., Daniel, R. & Mitterer, C., 2011, Proceeding of Multinational Congress on Microscopy. p. 29-30

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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