Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Research output: Contribution to conference › Poster › Research › peer-review
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| Translated title of the contribution | Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM |
|---|---|
| Original language | English |
| Publication status | Published - 2011 |
| Event | Microscopy Conference (MC2011) - Kiel, Germany Duration: 28 Aug 2011 → 2 Sept 2011 |
Conference
| Conference | Microscopy Conference (MC2011) |
|---|---|
| Country/Territory | Germany |
| City | Kiel |
| Period | 28/08/11 → 2/09/11 |
