Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM

Research output: Contribution to conferencePosterResearchpeer-review

Organisational units

Details

Translated title of the contributionAtomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Original languageEnglish
Publication statusPublished - 2011
EventMicroscopy Conference (MC2011) - Kiel, Germany
Duration: 28 Aug 20112 Sept 2011

Conference

ConferenceMicroscopy Conference (MC2011)
Country/TerritoryGermany
CityKiel
Period28/08/112/09/11