Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Research output: Contribution to conference › Poster › Research › peer-review
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Translated title of the contribution | Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM |
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Original language | English |
Publication status | Published - 2011 |
Event | Microscopy Conference (MC2011) - Kiel, Germany Duration: 28 Aug 2011 → 2 Sept 2011 |
Conference
Conference | Microscopy Conference (MC2011) |
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Country/Territory | Germany |
City | Kiel |
Period | 28/08/11 → 2/09/11 |