Research output

  1. 2006
  2. Published

    A new tensile stage for in situ X-ray scattering experiments combined with mechanical tests

    Martinschitz, K-J., Eiper, E., Keckes, J., Boesecke, P., Schwarzl, P. & Hofbauer, P., 2006.

    Research output: Contribution to conferencePosterResearchpeer-review

  3. Published

    Changes in the molecular orientation and tensile properties of uniaxially drawn cellulose films

    Gindl, W., Martinschitz, K-J., Boesecke, P. & Keckes, J., 2006, In: Biomacromolecules. p. 3146-3150

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    Characterization of optical anisotropy in oriented poly(ethylene terephthalate) films using refelctance difference spectroscopy

    Schmidegg, K., Sun, L., Maier, G. A., Keckes, J. & Zeppenfeld, P., 2006, In: Polymer. 47, p. 4768-4772

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published
  6. Published

    Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

    Eiper, E., Martinschitz, K-J. & Keckes, J., 2006, In: Powder diffraction. 21, p. 25-29

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    Cyclically deformed cellulose films characterized by in situ synchrotron diffraction coupled with tensile tests

    Martinschitz, K-J., Boesecke, P., Gindl, W. & Keckes, J., 2006.

    Research output: Contribution to conferencePosterResearchpeer-review

  8. Published

    DHS1100 - A new high temperature attachment for multipurpose 4-circle X-ray goniometers

    Resel, R., Keckes, J., Haber, T., Koini, M. & Hofbauer, P., 2006.

    Research output: Contribution to conferencePosterResearchpeer-review

  9. Published
  10. Published

    HPT-Deformation of copper an nickel single crystals

    Hafok, M., Vorhauer, A., Keckes, J. & Pippan, R., 2006, In: Materials Science Forum . 503-504, p. 621-626

    Research output: Contribution to journalArticleResearchpeer-review

  11. Published

    In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

    Keckes, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W. & Dehm, G., 2006, In: Advanced engineering materials. p. 1084-1088

    Research output: Contribution to journalArticleResearchpeer-review