Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

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Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing. / Moser, Gabriele; Felber, Herwig; Rashkova, Boryana et al.
In: Practical metallography = Praktische Metallographie, Vol. 49, 2012, p. 343-355.

Research output: Contribution to journalArticleResearchpeer-review

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@article{f507cdbd89c74dfb964c616fd9ea6bc3,
title = "Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing",
author = "Gabriele Moser and Herwig Felber and Boryana Rashkova and Imrich, {Peter J.} and Christoph Kirchlechner and Wolfgang Grosinger and C. Motz and Gerhard Dehm and Daniel Kiener",
year = "2012",
language = "English",
volume = "49",
pages = "343--355",
journal = "Practical metallography = Praktische Metallographie",
issn = "0032-678X",
publisher = "Carl Hanser Verlag GmbH & Co. KG",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing

AU - Moser, Gabriele

AU - Felber, Herwig

AU - Rashkova, Boryana

AU - Imrich, Peter J.

AU - Kirchlechner, Christoph

AU - Grosinger, Wolfgang

AU - Motz, C.

AU - Dehm, Gerhard

AU - Kiener, Daniel

PY - 2012

Y1 - 2012

M3 - Article

VL - 49

SP - 343

EP - 355

JO - Practical metallography = Praktische Metallographie

JF - Practical metallography = Praktische Metallographie

SN - 0032-678X

ER -