SAMPLE ANALYSIS SYSTEM
Research output: Patent
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Patent No.: WO2009027097. Mar 05, 2009.
Research output: Patent
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TY - PAT
T1 - SAMPLE ANALYSIS SYSTEM
AU - Froeschl, Juergen
AU - Eichlseder, Wilfried
PY - 2009/3/5
Y1 - 2009/3/5
N2 - An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a drive unit adapted for applying a force to the first clamping chuck, and a measurement unit adapted for measuring at least one physical parameter indicative of a property of the sample received by the first clamping chuck and the second clamping chuck in response to the application of the force to the first clamping chuck, wherein the second clamping chuck is free of a separate drive unit.
AB - An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a drive unit adapted for applying a force to the first clamping chuck, and a measurement unit adapted for measuring at least one physical parameter indicative of a property of the sample received by the first clamping chuck and the second clamping chuck in response to the application of the force to the first clamping chuck, wherein the second clamping chuck is free of a separate drive unit.
M3 - Patent
M1 - WO2009027097
ER -
