SAMPLE ANALYSIS SYSTEM
Research output: Patent
Authors
Organisational units
Abstract
An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a drive unit adapted for applying a force to the first clamping chuck, and a measurement unit adapted for measuring at least one physical parameter indicative of a property of the sample received by the first clamping chuck and the second clamping chuck in response to the application of the force to the first clamping chuck, wherein the second clamping chuck is free of a separate drive unit.
Details
Original language | English |
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Patent number | WO2009027097 |
Priority date | 31/08/07 |
Publication status | Published - 5 Mar 2009 |