SAMPLE ANALYSIS SYSTEM

Research output: Patent

Authors

Abstract

An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a drive unit adapted for applying a force to the first clamping chuck, and a measurement unit adapted for measuring at least one physical parameter indicative of a property of the sample received by the first clamping chuck and the second clamping chuck in response to the application of the force to the first clamping chuck, wherein the second clamping chuck is free of a separate drive unit.

Details

Original languageEnglish
Patent numberWO2009027097
Priority date31/08/07
Publication statusPublished - 5 Mar 2009