Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods

Research output: Contribution to conferencePosterResearchpeer-review

Authors

Organisational units

Details

Translated title of the contributionResidual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods
Original languageEnglish
Publication statusPublished - 2006
EventGordon Research Conference on thin film & small scale mechanical behavior - Waterville, United States
Duration: 30 Jul 20064 Aug 2006

Conference

ConferenceGordon Research Conference on thin film & small scale mechanical behavior
Country/TerritoryUnited States
CityWaterville
Period30/07/064/08/06