Profile Measurement via Circle-Line Spline Fitting

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Standard

Profile Measurement via Circle-Line Spline Fitting. / Harker, Matthew; O'Leary, Paul; Neumayr, Richard.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference. 2009. p. 1531-1536.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Harvard

Harker, M, O'Leary, P & Neumayr, R 2009, Profile Measurement via Circle-Line Spline Fitting. in Proceedings of the IEEE International Instrumentation and Measurement Technology Conference. pp. 1531-1536. https://doi.org/10.1109/IMTC.2009.5168698

APA

Harker, M., O'Leary, P., & Neumayr, R. (2009). Profile Measurement via Circle-Line Spline Fitting. In Proceedings of the IEEE International Instrumentation and Measurement Technology Conference (pp. 1531-1536) https://doi.org/10.1109/IMTC.2009.5168698

Vancouver

Harker M, O'Leary P, Neumayr R. Profile Measurement via Circle-Line Spline Fitting. In Proceedings of the IEEE International Instrumentation and Measurement Technology Conference. 2009. p. 1531-1536 doi: 10.1109/IMTC.2009.5168698

Author

Harker, Matthew ; O'Leary, Paul ; Neumayr, Richard. / Profile Measurement via Circle-Line Spline Fitting. Proceedings of the IEEE International Instrumentation and Measurement Technology Conference. 2009. pp. 1531-1536

Bibtex - Download

@inproceedings{ef14bcb216174796ab2705178363b4fb,
title = "Profile Measurement via Circle-Line Spline Fitting",
author = "Matthew Harker and Paul O'Leary and Richard Neumayr",
year = "2009",
doi = "10.1109/IMTC.2009.5168698",
language = "English",
isbn = "978-1-4244-3352-0",
pages = "1531--1536",
booktitle = "Proceedings of the IEEE International Instrumentation and Measurement Technology Conference",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Profile Measurement via Circle-Line Spline Fitting

AU - Harker, Matthew

AU - O'Leary, Paul

AU - Neumayr, Richard

PY - 2009

Y1 - 2009

U2 - 10.1109/IMTC.2009.5168698

DO - 10.1109/IMTC.2009.5168698

M3 - Conference contribution

SN - 978-1-4244-3352-0

SP - 1531

EP - 1536

BT - Proceedings of the IEEE International Instrumentation and Measurement Technology Conference

ER -

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