Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

Research output: Contribution to journal › Conference article › peer-review

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Positional and orientational referencing of multiple light sectioning systems for precision profile measurement. / Tratnig, Mark; Hlobil, Helmut; Reisinger, Johann et al.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5679, 10, 21.07.2005, p. 74-85.

Research output: Contribution to journal › Conference article › peer-review

Harvard

Tratnig, M, Hlobil, H, Reisinger, J & O'Leary, P 2005, 'Positional and orientational referencing of multiple light sectioning systems for precision profile measurement', Proceedings of SPIE - The International Society for Optical Engineering, vol. 5679, 10, pp. 74-85. https://doi.org/10.1117/12.586501

APA

Tratnig, M., Hlobil, H., Reisinger, J., & O'Leary, P. (2005). Positional and orientational referencing of multiple light sectioning systems for precision profile measurement. Proceedings of SPIE - The International Society for Optical Engineering, 5679, 74-85. Article 10. https://doi.org/10.1117/12.586501

Vancouver

Tratnig M, Hlobil H, Reisinger J, O'Leary P. Positional and orientational referencing of multiple light sectioning systems for precision profile measurement. Proceedings of SPIE - The International Society for Optical Engineering. 2005 Jul 21;5679:74-85. 10. doi: 10.1117/12.586501

Author

Tratnig, Mark ; Hlobil, Helmut ; Reisinger, Johann et al. / Positional and orientational referencing of multiple light sectioning systems for precision profile measurement. In: Proceedings of SPIE - The International Society for Optical Engineering. 2005 ; Vol. 5679. pp. 74-85.

Bibtex - Download

@article{75c86cba9b84403eac24874892103641,
title = "Positional and orientational referencing of multiple light sectioning systems for precision profile measurement",
keywords = "Collineation, Light sectioning, Precision strip, Referencing, Strip inspection, Visual inspection",
author = "Mark Tratnig and Helmut Hlobil and Johann Reisinger and Paul O'Leary",
year = "2005",
month = jul,
day = "21",
doi = "10.1117/12.586501",
language = "English",
volume = "5679",
pages = "74--85",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",
note = "Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII ; Conference date: 17-01-2005 Through 18-01-2005",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Positional and orientational referencing of multiple light sectioning systems for precision profile measurement

AU - Tratnig, Mark

AU - Hlobil, Helmut

AU - Reisinger, Johann

AU - O'Leary, Paul

PY - 2005/7/21

Y1 - 2005/7/21

KW - Collineation

KW - Light sectioning

KW - Precision strip

KW - Referencing

KW - Strip inspection

KW - Visual inspection

UR - http://www.scopus.com/inward/record.url?scp=21844474047&partnerID=8YFLogxK

U2 - 10.1117/12.586501

DO - 10.1117/12.586501

M3 - Conference article

AN - SCOPUS:21844474047

VL - 5679

SP - 74

EP - 85

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

M1 - 10

T2 - Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII

Y2 - 17 January 2005 through 18 January 2005

ER -

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