Positional and orientational referencing of multiple light sectioning systems for precision profile measurement
Research output: Contribution to journal › Conference article › peer-review
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- Schienen GmbH
Details
| Original language | English |
|---|---|
| Article number | 10 |
| Pages (from-to) | 74-85 |
| Number of pages | 12 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5679 |
| DOIs | |
| Publication status | Published - 21 Jul 2005 |
| Event | Proceedings of SPIE-IS and T Electronic Imaging - Machine Vision Applications in Industrial Inspection XIII - San Jose, CA, United States Duration: 17 Jan 2005 → 18 Jan 2005 |
