Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. / Handler, Johannes; O'Leary, Paul.
2022 IEEE International Instrumentation and Measurement Technology Conference. 2022.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Handler, J & O'Leary, P 2022, Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. in 2022 IEEE International Instrumentation and Measurement Technology Conference. 2022 IEEE International Instrumentation and Measurement Technology Conference , Ottawa, Quebec, Canada, 16/05/22. https://doi.org/10.1109/I2MTC48687.2022.9806594

Vancouver

Handler J, O'Leary P. Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. In 2022 IEEE International Instrumentation and Measurement Technology Conference. 2022 Epub 2022. doi: 10.1109/I2MTC48687.2022.9806594

Author

Handler, Johannes ; O'Leary, Paul. / Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. 2022 IEEE International Instrumentation and Measurement Technology Conference. 2022.

Bibtex - Download

@inproceedings{14ad0164279b475292b6accfe4443c7b,
title = "Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements",
author = "Johannes Handler and Paul O'Leary",
year = "2022",
doi = "10.1109/I2MTC48687.2022.9806594",
language = "English",
booktitle = "2022 IEEE International Instrumentation and Measurement Technology Conference",
note = "2022 IEEE International Instrumentation and Measurement Technology Conference ; Conference date: 16-05-2022 Through 19-05-2022",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements

AU - Handler, Johannes

AU - O'Leary, Paul

PY - 2022

Y1 - 2022

U2 - 10.1109/I2MTC48687.2022.9806594

DO - 10.1109/I2MTC48687.2022.9806594

M3 - Conference contribution

BT - 2022 IEEE International Instrumentation and Measurement Technology Conference

T2 - 2022 IEEE International Instrumentation and Measurement Technology Conference

Y2 - 16 May 2022 through 19 May 2022

ER -