Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements
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Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. / Handler, Johannes; O'Leary, Paul.
2022 IEEE International Instrumentation and Measurement Technology Conference. 2022.
2022 IEEE International Instrumentation and Measurement Technology Conference. 2022.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Handler, J & O'Leary, P 2022, Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. in 2022 IEEE International Instrumentation and Measurement Technology Conference. 2022 IEEE International Instrumentation and Measurement Technology Conference , Ottawa, Quebec, Kanada, 16/05/22. https://doi.org/10.1109/I2MTC48687.2022.9806594
APA
Handler, J., & O'Leary, P. (2022). Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. In 2022 IEEE International Instrumentation and Measurement Technology Conference https://doi.org/10.1109/I2MTC48687.2022.9806594
Vancouver
Handler J, O'Leary P. Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements. in 2022 IEEE International Instrumentation and Measurement Technology Conference. 2022 Epub 2022. doi: 10.1109/I2MTC48687.2022.9806594
Author
Bibtex - Download
@inproceedings{14ad0164279b475292b6accfe4443c7b,
title = "Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements",
author = "Johannes Handler and Paul O'Leary",
year = "2022",
doi = "10.1109/I2MTC48687.2022.9806594",
language = "English",
booktitle = "2022 IEEE International Instrumentation and Measurement Technology Conference",
note = "2022 IEEE International Instrumentation and Measurement Technology Conference ; Conference date: 16-05-2022 Through 19-05-2022",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Pavement Macrotexture Evaluation for Tire Test Benches using Surface Profile Measurements
AU - Handler, Johannes
AU - O'Leary, Paul
PY - 2022
Y1 - 2022
U2 - 10.1109/I2MTC48687.2022.9806594
DO - 10.1109/I2MTC48687.2022.9806594
M3 - Conference contribution
BT - 2022 IEEE International Instrumentation and Measurement Technology Conference
T2 - 2022 IEEE International Instrumentation and Measurement Technology Conference
Y2 - 16 May 2022 through 19 May 2022
ER -
