Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
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In: Nanotechnology, Vol. 18, 2007, p. 195301-1-195301-8.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
AU - Brauer, G.
AU - Anwand, W.
AU - Grambole, D.
AU - Skorupa, W.
AU - Hou, Yue
AU - Andreev, Andrei
AU - Teichert, Christian
AU - Tam, K. H.
AU - Djurisic, A. B.
PY - 2007
Y1 - 2007
U2 - 10.1088/0957-4484/18/19/195301
DO - 10.1088/0957-4484/18/19/195301
M3 - Article
VL - 18
SP - 195301-1-195301-8
JO - Nanotechnology
JF - Nanotechnology
SN - 0957-4484
ER -