Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis. / Brauer, G.; Anwand, W.; Grambole, D. et al.
in: Nanotechnology, Jahrgang 18, 2007, S. 195301-1-195301-8.
in: Nanotechnology, Jahrgang 18, 2007, S. 195301-1-195301-8.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Brauer, G, Anwand, W, Grambole, D, Skorupa, W, Hou, Y, Andreev, A, Teichert, C, Tam, KH & Djurisic, AB 2007, 'Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis', Nanotechnology, Jg. 18, S. 195301-1-195301-8. https://doi.org/10.1088/0957-4484/18/19/195301
APA
Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H., & Djurisic, A. B. (2007). Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis. Nanotechnology, 18, 195301-1-195301-8. https://doi.org/10.1088/0957-4484/18/19/195301
Vancouver
Brauer G, Anwand W, Grambole D, Skorupa W, Hou Y, Andreev A et al. Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis. Nanotechnology. 2007;18:195301-1-195301-8. doi: 10.1088/0957-4484/18/19/195301
Author
Bibtex - Download
@article{e2de485410a3409886b25a83042c551e,
title = "Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis",
author = "G. Brauer and W. Anwand and D. Grambole and W. Skorupa and Yue Hou and Andrei Andreev and Christian Teichert and Tam, {K. H.} and Djurisic, {A. B.}",
year = "2007",
doi = "10.1088/0957-4484/18/19/195301",
language = "English",
volume = "18",
pages = "195301--1--195301--8",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "IOP Publishing Ltd.",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
AU - Brauer, G.
AU - Anwand, W.
AU - Grambole, D.
AU - Skorupa, W.
AU - Hou, Yue
AU - Andreev, Andrei
AU - Teichert, Christian
AU - Tam, K. H.
AU - Djurisic, A. B.
PY - 2007
Y1 - 2007
U2 - 10.1088/0957-4484/18/19/195301
DO - 10.1088/0957-4484/18/19/195301
M3 - Article
VL - 18
SP - 195301-1-195301-8
JO - Nanotechnology
JF - Nanotechnology
SN - 0957-4484
ER -
