Multi-Layer Palladium Diselenide as a Contact Material for Two-Dimensional Tungsten Diselenide Field-Effect Transistors
Research output: Contribution to journal › Article › Research › peer-review
Standard
In: Nanomaterials, Vol. 14.2024, No. 5, 481, 06.03.2024.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Multi-Layer Palladium Diselenide as a Contact Material for Two-Dimensional Tungsten Diselenide Field-Effect Transistors
AU - Murastov, Gennadiy
AU - Aslam, Muhammad Awais
AU - Leitner, Simon
AU - Tkachuk, Vadym
AU - Plutnarová, Iva
AU - Pavlica, Egon
AU - Rodriguez, Raul D.
AU - Sofer, Zdenek
AU - Matkovic, Aleksandar
N1 - Publisher Copyright: © 2024 by the authors.
PY - 2024/3/6
Y1 - 2024/3/6
N2 - Tungsten diselenide ((Formula presented.)) has emerged as a promising ambipolar semiconductor material for field-effect transistors (FETs) due to its unique electronic properties, including a sizeable band gap, high carrier mobility, and remarkable on–off ratio. However, engineering the contacts to (Formula presented.) remains an issue, and high contact barriers prevent the utilization of the full performance in electronic applications. Furthermore, it could be possible to tune the contacts to (Formula presented.) for effective electron or hole injection and consequently pin the threshold voltage to either conduction or valence band. This would be the way to achieve complementary metal–oxide–semiconductor devices without doping of the channel material.This study investigates the behaviour of two-dimensional (Formula presented.) field-effect transistors with multi-layer palladium diselenide ((Formula presented.)) as a contact material. We demonstrate that (Formula presented.) contacts favour hole injection while preserving the ambipolar nature of the channel material. This consequently yields high-performance p-type (Formula presented.) devices with (Formula presented.) van der Waals contacts. Further, we explore the tunability of the contact interface by selective laser alteration of the (Formula presented.) under the contacts, enabling pinning of the threshold voltage to the valence band of (Formula presented.), yielding pure p-type operation of the devices.
AB - Tungsten diselenide ((Formula presented.)) has emerged as a promising ambipolar semiconductor material for field-effect transistors (FETs) due to its unique electronic properties, including a sizeable band gap, high carrier mobility, and remarkable on–off ratio. However, engineering the contacts to (Formula presented.) remains an issue, and high contact barriers prevent the utilization of the full performance in electronic applications. Furthermore, it could be possible to tune the contacts to (Formula presented.) for effective electron or hole injection and consequently pin the threshold voltage to either conduction or valence band. This would be the way to achieve complementary metal–oxide–semiconductor devices without doping of the channel material.This study investigates the behaviour of two-dimensional (Formula presented.) field-effect transistors with multi-layer palladium diselenide ((Formula presented.)) as a contact material. We demonstrate that (Formula presented.) contacts favour hole injection while preserving the ambipolar nature of the channel material. This consequently yields high-performance p-type (Formula presented.) devices with (Formula presented.) van der Waals contacts. Further, we explore the tunability of the contact interface by selective laser alteration of the (Formula presented.) under the contacts, enabling pinning of the threshold voltage to the valence band of (Formula presented.), yielding pure p-type operation of the devices.
KW - palladium diselenide
KW - tungsten diselenide
KW - tungsten selenium oxide
KW - semi-metal
KW - laser treatment
KW - contact engineering
KW - field-effect transistor
KW - pMOS
KW - van der Waals electronics
KW - 2D Materials
KW - 2D materials
UR - https://doi.org/10.3390/nano14050481
U2 - 10.3390/nano14050481
DO - 10.3390/nano14050481
M3 - Article
VL - 14.2024
JO - Nanomaterials
JF - Nanomaterials
SN - 2079-4991
IS - 5
M1 - 481
ER -