Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x. / Teichert, Christian.
2009. Poster session presented at DPG Dresden, Dresden, Germany.
2009. Poster session presented at DPG Dresden, Dresden, Germany.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Teichert, C 2009, 'Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x', DPG Dresden, Dresden, Germany, 23/03/09 - 27/03/09.
APA
Teichert, C. (2009). Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x. Poster session presented at DPG Dresden, Dresden, Germany.
Vancouver
Teichert C. Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x. 2009. Poster session presented at DPG Dresden, Dresden, Germany.
Author
Bibtex - Download
@conference{1e69acf89730472cb8d968f51bbed809,
title = "Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x",
author = "Christian Teichert",
year = "2009",
language = "English",
note = "DPG Dresden ; Conference date: 23-03-2009 Through 27-03-2009",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x
AU - Teichert, Christian
PY - 2009
Y1 - 2009
M3 - Poster
T2 - DPG Dresden
Y2 - 23 March 2009 through 27 March 2009
ER -
