MEMS test bench and its uncertainty analysis for evaluation of MEMS mirrors
Research output: Contribution to journal › Conference article › peer-review
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In: IFAC-PapersOnLine, Vol. 52, No. 15, 09.2019, p. 49-54.
Research output: Contribution to journal › Conference article › peer-review
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TY - JOUR
T1 - MEMS test bench and its uncertainty analysis for evaluation of MEMS mirrors
AU - Han Woong, Yoo
AU - Brunner, David
AU - Thurner, Thomas
AU - Schitter, Georg
N1 - Publisher Copyright: © 2019, IFAC (International Federation of Automatic Control) Hosting by Elsevier Ltd. All rights reserved.
PY - 2019/9
Y1 - 2019/9
KW - Characterization
KW - MEMS mirror
KW - Metrology
KW - Microelectromechanical systems (MEMS)
KW - Uncertainty analysis
UR - http://www.scopus.com/inward/record.url?scp=85077498382&partnerID=8YFLogxK
U2 - 10.1016/j.ifacol.2019.11.648
DO - 10.1016/j.ifacol.2019.11.648
M3 - Conference article
AN - SCOPUS:85077498382
VL - 52
SP - 49
EP - 54
JO - IFAC-PapersOnLine
JF - IFAC-PapersOnLine
SN - 2405-8963
IS - 15
T2 - 8th IFAC Symposium on Mechatronic Systems, MECHATRONICS 2019
Y2 - 4 September 2019 through 6 September 2019
ER -