Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks
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In: Materials Today: Proceedings, Vol. 4.2017, No. 7, Part 2, 19.09.2017, p. 7122-7127.
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TY - JOUR
T1 - Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks
AU - Grünwald, Eva
AU - Nuster, Robert
AU - Paltauf, Günther
AU - Maier, Thomas
AU - Wimmer-Teubenbacher, Robert
AU - Konetschnik, Ruth
AU - Kiener, Daniel
AU - Leitgeb, Verena
AU - Köck, Anton
AU - Brunner, Roland
PY - 2017/9/19
Y1 - 2017/9/19
KW - Laser Ultrasound
KW - Multi-Layered Systems
KW - Stack Charakterization
KW - Thin Film Characterization
UR - http://www.scopus.com/inward/record.url?scp=85029477173&partnerID=8YFLogxK
U2 - 10.1016/j.matpr.2017.08.006
DO - 10.1016/j.matpr.2017.08.006
M3 - Article
AN - SCOPUS:85029477173
VL - 4.2017
SP - 7122
EP - 7127
JO - Materials Today: Proceedings
JF - Materials Today: Proceedings
SN - 2214-7853
IS - 7, Part 2
ER -