Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Standard
Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning. / O'Leary, Paul; Schalk, Peter; Ofner, Ronald et al.
IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference. Inst. of Electrical and Electronics Engineers, 2006. p. 1108-1113.
IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference. Inst. of Electrical and Electronics Engineers, 2006. p. 1108-1113.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
O'Leary, P, Schalk, P, Ofner, R & Gfrerrer, A 2006, Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning. in IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference. Inst. of Electrical and Electronics Engineers, pp. 1108-1113.
APA
O'Leary, P., Schalk, P., Ofner, R., & Gfrerrer, A. (2006). Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning. In IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference (pp. 1108-1113). Inst. of Electrical and Electronics Engineers.
Vancouver
O'Leary P, Schalk P, Ofner R, Gfrerrer A. Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning. In IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference. Inst. of Electrical and Electronics Engineers. 2006. p. 1108-1113
Author
Bibtex - Download
@inproceedings{85fe643b00084bf4939f16466665415b,
title = "Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning",
author = "Paul O'Leary and Peter Schalk and Ronald Ofner and Anton Gfrerrer",
year = "2006",
language = "English",
isbn = "0-7803-9360-0",
pages = "1108--1113",
booktitle = "IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference",
publisher = "Inst. of Electrical and Electronics Engineers",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Instrumentation and Analysis-Methods for the Measurement of Profiles using Light Sectioning
AU - O'Leary, Paul
AU - Schalk, Peter
AU - Ofner, Ronald
AU - Gfrerrer, Anton
PY - 2006
Y1 - 2006
M3 - Conference contribution
SN - 0-7803-9360-0
SP - 1108
EP - 1113
BT - IMTC/06 Proceeding of the 23rd IEEE Instrumentation and Measurement Technology Conference
PB - Inst. of Electrical and Electronics Engineers
ER -
