In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
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| Translated title of the contribution | In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings |
|---|---|
| Original language | English |
| Pages (from-to) | 705-711 |
| Journal | Advanced engineering materials |
| Publication status | Published - 2011 |
