In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

Research output: Book/ReportAnthologyResearch

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@book{9839abf058c7405f9c1034a064ad91cc,
title = "In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)",
abstract = "Konferenzort: Leoben Konferenzdatum: 02.10.09",
editor = "Christian Teichert",
year = "2009",
language = "English",
publisher = "Eigenverlag",

}

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TY - BOOK

T1 - In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

A2 - Teichert, Christian

PY - 2009

Y1 - 2009

N2 - Konferenzort: Leoben Konferenzdatum: 02.10.09

AB - Konferenzort: Leoben Konferenzdatum: 02.10.09

M3 - Anthology

BT - In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

PB - Eigenverlag

ER -