In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
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In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM). / Teichert, Christian (Herausgeber).
Eigenverlag, 2009.
Eigenverlag, 2009.
Publikationen: Buch/Bericht › Sammelband › Forschung
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@book{9839abf058c7405f9c1034a064ad91cc,
title = "In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)",
abstract = "Konferenzort: Leoben Konferenzdatum: 02.10.09",
editor = "Christian Teichert",
year = "2009",
language = "English",
publisher = "Eigenverlag",
}
RIS (suitable for import to EndNote) - Download
TY - BOOK
T1 - In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
A2 - Teichert, Christian
PY - 2009
Y1 - 2009
N2 - Konferenzort: Leoben Konferenzdatum: 02.10.09
AB - Konferenzort: Leoben Konferenzdatum: 02.10.09
M3 - Anthology
BT - In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
PB - Eigenverlag
ER -
