Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
Research output: Contribution to journal › Article › Research › peer-review
Standard
Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. / Bennett, S.E.; Holec, David; Kappers, M.J. et al.
In: Review of scientific instruments, 2010, p. 0637011-0637017.
In: Review of scientific instruments, 2010, p. 0637011-0637017.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Bennett, SE, Holec, D, Kappers, MJ, Humphreys, CJ & Oliver, RA 2010, 'Imaging dislocations in gallium nitride across broad areas using atomic force microscopy', Review of scientific instruments, pp. 0637011-0637017. https://doi.org/10.1063/1.3430539
APA
Bennett, S. E., Holec, D., Kappers, M. J., Humphreys, C. J., & Oliver, R. A. (2010). Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. Review of scientific instruments, 0637011-0637017. https://doi.org/10.1063/1.3430539
Vancouver
Bennett SE, Holec D, Kappers MJ, Humphreys CJ, Oliver RA. Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. Review of scientific instruments. 2010;0637011-0637017. doi: 10.1063/1.3430539
Author
Bibtex - Download
@article{30787dda3db64e09848c306cbecbfe25,
title = "Imaging dislocations in gallium nitride across broad areas using atomic force microscopy",
author = "S.E. Bennett and David Holec and M.J. Kappers and C.J. Humphreys and R.A. Oliver",
year = "2010",
doi = "10.1063/1.3430539",
language = "English",
pages = "0637011--0637017",
journal = "Review of scientific instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
AU - Bennett, S.E.
AU - Holec, David
AU - Kappers, M.J.
AU - Humphreys, C.J.
AU - Oliver, R.A.
PY - 2010
Y1 - 2010
U2 - 10.1063/1.3430539
DO - 10.1063/1.3430539
M3 - Article
SP - 637011
EP - 637017
JO - Review of scientific instruments
JF - Review of scientific instruments
SN - 0034-6748
ER -
