Galvanic corrosion of molybdenum alloys and oxides in contact with copper for thin film transistors using evans diagrams

Research output: Contribution to journalConference articlepeer-review

External Organisational units

  • Plansee (Shanghai)
  • PLANSEE SE

Details

Original languageEnglish
Pages (from-to)588-590
Number of pages3
JournalDigest of technical papers
Volume52
Issue numberS2
DOIs
Publication statusPublished - 2021
EventInternational Conference on Display Technology, ICDT 2021 - Beijing, China
Duration: 30 May 20212 Jun 2021