Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy
Research output: Contribution to journal › Article › Research › peer-review
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Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy. / Shen, Quan; Edler, Matthias; Grießer, Thomas et al.
In: Scanning, Vol. 36, 2014, p. 590-598.
In: Scanning, Vol. 36, 2014, p. 590-598.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Shen, Q, Edler, M, Grießer, T, Knall, A-C, Trimmel, G, Kern, W & Teichert, C 2014, 'Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy', Scanning, vol. 36, pp. 590-598. https://doi.org/10.1002/sca.21159
APA
Vancouver
Shen Q, Edler M, Grießer T, Knall AC, Trimmel G, Kern W et al. Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy. Scanning. 2014;36:590-598. doi: 10.1002/sca.21159
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Bibtex - Download
@article{1d5fb109a60c43199f7a74e8546c60bc,
title = "Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy",
author = "Quan Shen and Matthias Edler and Thomas Grie{\ss}er and Astrid-Caroline Knall and Gregor Trimmel and Wolfgang Kern and Christian Teichert",
year = "2014",
doi = "10.1002/sca.21159",
language = "English",
volume = "36",
pages = "590--598",
journal = "Scanning",
issn = "0161-0457",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy
AU - Shen, Quan
AU - Edler, Matthias
AU - Grießer, Thomas
AU - Knall, Astrid-Caroline
AU - Trimmel, Gregor
AU - Kern, Wolfgang
AU - Teichert, Christian
PY - 2014
Y1 - 2014
U2 - 10.1002/sca.21159
DO - 10.1002/sca.21159
M3 - Article
VL - 36
SP - 590
EP - 598
JO - Scanning
JF - Scanning
SN - 0161-0457
ER -
