Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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in: Scanning, Jahrgang 36, 2014, S. 590-598.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy
AU - Shen, Quan
AU - Edler, Matthias
AU - Grießer, Thomas
AU - Knall, Astrid-Caroline
AU - Trimmel, Gregor
AU - Kern, Wolfgang
AU - Teichert, Christian
PY - 2014
Y1 - 2014
U2 - 10.1002/sca.21159
DO - 10.1002/sca.21159
M3 - Article
VL - 36
SP - 590
EP - 598
JO - Scanning
JF - Scanning
SN - 0161-0457
ER -