Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films. / Rachbauer, Richard; Holec, David; Martina, Lattemann et al.
2011. Poster session presented at ISSC, Warwick, United Kingdom.
2011. Poster session presented at ISSC, Warwick, United Kingdom.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Rachbauer, R, Holec, D, Martina, L, Lars, H & Mayrhofer, PH 2011, 'Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films', ISSC, Warwick, United Kingdom, 4/04/11 - 7/04/11.
APA
Rachbauer, R., Holec, D., Martina, L., Lars, H., & Mayrhofer, P. H. (2011). Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films. Poster session presented at ISSC, Warwick, United Kingdom.
Vancouver
Rachbauer R, Holec D, Martina L, Lars H, Mayrhofer PH. Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films. 2011. Poster session presented at ISSC, Warwick, United Kingdom.
Author
Bibtex - Download
@conference{19d20ada0b9f4329bb1199eb54d0c3db,
title = "Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films",
author = "Richard Rachbauer and David Holec and Lattemann Martina and Hultman Lars and Mayrhofer, {Paul Heinz}",
year = "2011",
language = "English",
note = "ISSC ; Conference date: 04-04-2011 Through 07-04-2011",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films
AU - Rachbauer, Richard
AU - Holec, David
AU - Martina, Lattemann
AU - Lars, Hultman
AU - Mayrhofer, Paul Heinz
PY - 2011
Y1 - 2011
M3 - Poster
T2 - ISSC
Y2 - 4 April 2011 through 7 April 2011
ER -
