Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films
Research output: Contribution to conference › Poster › Research › peer-review
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Details
| Translated title of the contribution | Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti-Al-N thin films |
|---|---|
| Original language | English |
| Publication status | Published - 2011 |
| Event | ISSC - Warwick, United Kingdom Duration: 4 Apr 2011 → 7 Apr 2011 |
Conference
| Conference | ISSC |
|---|---|
| Abbreviated title | ISSC-18 |
| Country/Territory | United Kingdom |
| City | Warwick |
| Period | 4/04/11 → 7/04/11 |
