Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

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@article{22104b42081f4c5ba61c070dbd6e2091,
title = "Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy",
author = "Martin Schloffer and Christian Teichert and Peter Supancic and Andrei Andreev and Yue Hou and Zhonghua Wang",
year = "2010",
doi = "10.1016/j.jeurceramsoc.2010.01.005",
language = "English",
volume = "30",
pages = "1761--1764",
journal = "Journal of the European Ceramic Society",
issn = "0955-2219",
publisher = "Elsevier",

}

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TY - JOUR

T1 - Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

AU - Schloffer, Martin

AU - Teichert, Christian

AU - Supancic, Peter

AU - Andreev, Andrei

AU - Hou, Yue

AU - Wang, Zhonghua

PY - 2010

Y1 - 2010

U2 - 10.1016/j.jeurceramsoc.2010.01.005

DO - 10.1016/j.jeurceramsoc.2010.01.005

M3 - Article

VL - 30

SP - 1761

EP - 1764

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

SN - 0955-2219

ER -