Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
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In: Journal of the European Ceramic Society, Vol. 30, 2010, p. 1761-1764.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
AU - Schloffer, Martin
AU - Teichert, Christian
AU - Supancic, Peter
AU - Andreev, Andrei
AU - Hou, Yue
AU - Wang, Zhonghua
PY - 2010
Y1 - 2010
U2 - 10.1016/j.jeurceramsoc.2010.01.005
DO - 10.1016/j.jeurceramsoc.2010.01.005
M3 - Article
VL - 30
SP - 1761
EP - 1764
JO - Journal of the European Ceramic Society
JF - Journal of the European Ceramic Society
SN - 0955-2219
ER -